DC1000A/1000V
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  • DC1000A/1000V

DC1000A/1000V

Uncontrolled silicon rectifier power supply

The DC-1000A/1000V non-silicon rectifier power supply device is used as a general industrial DC power supply. The device consists of a cabinet, silicon rectifier components, circuit breakers, protection and control electrical components, etc. The main power supply line is powered by a three-phase 0-800V 50Hz AC power supply, and the control power supply is powered by a three-phase 380V50Hz power supply.

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Techicel Conditions

Usage environmentThe altitude does not exceed 1000 meters,
Relative humidity of the airLess than 85%, no conductive dust Egyptian corrosive gas.
Ambient temperature-10℃-+55℃。
Cabinet mounting tiltNot greater than 5°
Input voltageThe main circuit is three-phase 0-800V 50Hz, and the control loop is three-phase 380V.
Rated DC output voltage 1000V
Rated DC output current1000A
Cooling methodSelf-cooling

FAQ

Here, common questions are answered and clarified

Voltage fluctuation fault

Youdaoplaceholder6 Common causes:
- The external power supply is unstable or abnormal.
- There is a wiring error during the operation of the equipment.
- Environmental factors (such as temperature changes) cause voltage fluctuations.
● Solve the problem:
- Use a reliable power supply and avoid relying on external power sources.
- Check and adjust the connection method of the equipment.
- Reserve sufficient protection circuits or use step-down circuits to limit the impact of voltage fluctuations.

Short-circuit fault

● Youdaoplaceholder6 Common causes:
- Internal circuit short circuit (such as coil damage).
- External short circuit (such as short-circuiting of power pins).
● Solve the problem:
- Inspect the internal structure of the equipment, identify and repair the short-circuit points in the internal circuits.
- Use disconnected pins or external pins for protection and isolation.
- Reserve sufficient buffer layers or cooling systems to prevent the silicon wafers from overheating and getting damaged.

Current out-of-control (IQN) fault

Youdaoplaceholder6 Common causes:
- The external current is too large, causing the silicon wafer to bear an excessively high current.
- During the operation of the o equipment, the load was too heavy, causing the silicon wafers to be overloaded.
● Solve the problem:
- Reserve sufficient safety current to ensure that the current during equipment operation does not exceed the designed maximum value of the silicon wafer.
- Use protection circuits or step-down circuits to limit the influence of external currents.
- Reserve sufficient buffer layers to prevent excessive current from damaging the silicon wafer.

Excessively high temperature fault

Youdaoplaceholder6 Common causes:
- High-temperature environments cause silicon wafers to expand due to heat and get damaged.
- The cooling system failed to effectively cool the silicon wafers.
 Solve the problem:
- Reserve sufficient buffer layers or cooling systems to prevent the silicon wafers from overheating and getting damaged.
- Use a heat sink or coolant (such as water) to lower the temperature of the silicon wafer.
- Regularly inspect and maintain the cooling system of the equipment.

Overload fault

Youdaoplaceholder6 Common causes:
- During the operation of the equipment, the load was too heavy, causing the silicon wafers to bear excessive current.
- If the external load exceeds the design maximum value of the silicon wafer, it may cause damage to the silicon wafer.
● Solve the problem:
- Reserve sufficient safety load to ensure that the load during equipment operation does not exceed the design maximum value of the silicon wafer.
- Use protection circuits or step-down circuits to limit the influence of external loads.
- Reserve sufficient buffer layers to prevent the silicon wafer from being damaged due to excessive load.

Summary of Solutions for Current Anomaly (IQN) Faults

Test with a volt-ampere meter: Measure the output voltage and current to ensure they meet the design parameters of the silicon wafer.
● Apply phase difference test: Check the phase deviation of the silicon wafer to ensure its stability in AC signals.
● Dynamic calibration equipment: Dynamically adjust the equipment or external power supply according to the actual working environment (such as temperature changes).
Through regular Testing and Diagnosis processes, faults of thyristor equipment can be identified and resolved more accurately.

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Certification

It has passed the ISO9001:2015 quality management system certification. In 2005, it was awarded the titles of "National Rectifier Product Quality Assurance and Honest Business Demonstration Unit" and "National AAA Quality Brand Enterprise" by the China Marketing Association. It has been rated as a "Contract-abiding and Creditworthy Enterprise" by the Wuhan Administration for Industry and Commerce for many years.

System Cert ificate

System Cert ificate

System Cert ificate

System Cert ificate

System Cert ificate

System Cert ificate

Patent Certificate

Patent Certificate

Patent Certificate

Patent Certificate

Patent Certificate

Patent Certificate

Patent Certificate

Patent Certificate

Patent Certificate

Patent Certificate

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Project Case

Be courageous to leap forward, pursue excellence, forge ahead and strive for the first-class

Overseas Cooperation Project

Overseas Cooperation Project

Overseas Cooperation Project

Overseas Cooperation Project

Overseas Cooperation Project

Overseas Cooperation Project

Overseas Cooperation Project

Overseas Cooperation Project

Overseas Cooperation Project

Overseas Cooperation Project

Overseas Cooperation Project

Overseas Cooperation Project

Overseas Cooperation Project

Overseas Cooperation Project

Overseas Cooperation Project

Overseas Cooperation Project

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Factory

The total number of employees in the unit, including the situation, number and composition ratio of technical personnel at all levels, currently has over 60 employees, including more than 18 engineering and technical personnel. Among them, there are 4 senior engineers, 10 engineers, and 4 assistant engineers and technicians.

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