The dual-pulse capacitor charger is mainly used for capacitor charging. It features a single-phase AC 220V input, voltage regulation by an autotransformer voltage regulator, rectification by two sets of single-phase bridge diodes, and a dual-loop output of 1100VDC. It is equipped with a discharge circuit. After the test is completed, press the discharge button to connect the discharge relay. The charge on the capacitor is discharged through the 20K current-limiting resistor. Observe that the voltage on the voltmeter returns to zero. Then release the discharge button and the discharge is complete.
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Techicel Conditions
| Rated AC input voltage | Single-phase AC220V 50Hz |
| Output DC power | 2kW |
| Rated DC output voltage | DC± 10V-DC1000V max. ±1100V; (Continuously adjustable) |
| Rated DC charging current | 1A |
| Pressure regulation method | The voltage regulation mode of the rotary wheel of the autotransformer is the two-way single-phase bridge rectifier circuit on the secondary side of the boost transformer |
| Cooling method | Self-cooling |
| Instrument chassis structure | The AC power cable plug connects and outputs the DC charging voltage from the backplane socket, and outputs it through the binding post under the front panel, corresponding to +1100V, OV, and -1100V respectively. |
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FAQ
Here, common questions are answered and clarified
Voltage fluctuation fault
● Youdaoplaceholder6 Common causes:
- The external power supply is unstable or abnormal.
- There is a wiring error during the operation of the equipment.
- Environmental factors (such as temperature changes) cause voltage fluctuations.
● Solve the problem:
- Use a reliable power supply and avoid relying on external power sources.
- Check and adjust the connection method of the equipment.
- Reserve sufficient protection circuits or use step-down circuits to limit the impact of voltage fluctuations.
Short-circuit fault
● Youdaoplaceholder6 Common causes:
- Internal circuit short circuit (such as coil damage).
- External short circuit (such as short-circuiting of power pins).
● Solve the problem:
- Inspect the internal structure of the equipment, identify and repair the short-circuit points in the internal circuits.
- Use disconnected pins or external pins for protection and isolation.
- Reserve sufficient buffer layers or cooling systems to prevent the silicon wafers from overheating and getting damaged.
Current out-of-control (IQN) fault
● Youdaoplaceholder6 Common causes:
- The external current is too large, causing the silicon wafer to bear an excessively high current.
- During the operation of the o equipment, the load was too heavy, causing the silicon wafers to be overloaded.
● Solve the problem:
- Reserve sufficient safety current to ensure that the current during equipment operation does not exceed the designed maximum value of the silicon wafer.
- Use protection circuits or step-down circuits to limit the influence of external currents.
- Reserve sufficient buffer layers to prevent excessive current from damaging the silicon wafer.
Excessively high temperature fault
● Youdaoplaceholder6 Common causes:
- High-temperature environments cause silicon wafers to expand due to heat and get damaged.
- The cooling system failed to effectively cool the silicon wafers.
● Solve the problem:
- Reserve sufficient buffer layers or cooling systems to prevent the silicon wafers from overheating and getting damaged.
- Use a heat sink or coolant (such as water) to lower the temperature of the silicon wafer.
- Regularly inspect and maintain the cooling system of the equipment.
Overload fault
● Youdaoplaceholder6 Common causes:
- During the operation of the equipment, the load was too heavy, causing the silicon wafers to bear excessive current.
- If the external load exceeds the design maximum value of the silicon wafer, it may cause damage to the silicon wafer.
● Solve the problem:
- Reserve sufficient safety load to ensure that the load during equipment operation does not exceed the design maximum value of the silicon wafer.
- Use protection circuits or step-down circuits to limit the influence of external loads.
- Reserve sufficient buffer layers to prevent the silicon wafer from being damaged due to excessive load.
Summary of Solutions for Current Anomaly (IQN) Faults
● Test with a volt-ampere meter: Measure the output voltage and current to ensure they meet the design parameters of the silicon wafer.
● Apply phase difference test: Check the phase deviation of the silicon wafer to ensure its stability in AC signals.
● Dynamic calibration equipment: Dynamically adjust the equipment or external power supply according to the actual working environment (such as temperature changes).
Through regular Testing and Diagnosis processes, faults of thyristor equipment can be identified and resolved more accurately.
Certification
It has passed the ISO9001:2015 quality management system certification. In 2005, it was awarded the titles of "National Rectifier Product Quality Assurance and Honest Business Demonstration Unit" and "National AAA Quality Brand Enterprise" by the China Marketing Association. It has been rated as a "Contract-abiding and Creditworthy Enterprise" by the Wuhan Administration for Industry and Commerce for many years.
Project Case
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Factory
The total number of employees in the unit, including the situation, number and composition ratio of technical personnel at all levels, currently has over 60 employees, including more than 18 engineering and technical personnel. Among them, there are 4 senior engineers, 10 engineers, and 4 assistant engineers and technicians.
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As a designated manufacturer of rectifiers by the former Ministry of Machinery Industry, we specialize in the production of electrolytic and electrochemical rectifiers. We have numerous production achievements and rich manufacturing experience in the electrolytic copper industry.